Hello,
I am trying to build a tool to fit measurement data to a mathematical model. The goal is to characterize defects on irradiated silicon sensors.
The measurement consists in recording the electrical current through the detector while changing its temperature. So, from my measurement I obtain three arrays of data: (time (t), Temperature (T), Current (I))
The current is mathematically described as:
I[k] = n_0[k] x e_0[k] + ... + n_i[k] x e_i[k] + ... + n_N[k] x e_N[k]
where N is the number of defect levels in my irradiated sensor, and for each level i, n_i[k] and e_i[k] are described as follows:
e_i[k] = p0_i * T[k]^2 * F(T[k]) * exp (-p1_i / (K * T[k]) )
n_i[k] = p2_i * exp ( -e_i[k] * C) * n_i[k-1]
where F(T) is a tabulated function, and K and C are known constants. p0_i , p1_i and p2_i are the parameters that I am trying to fit.
I do not know if such a complicated function can be implemented and fitted in ROOT somehow. I am especially concerned by the fact that the measured current depends not only on the instant temperature but on the history (n_i[k] depends on n_i[k-1]).
I am quite new in ROOT so I am still trying to understand which set of functions I should use (or, even, if this is feasible at all). For the moment I am quite lost, so any hint will be greatly appreciated.
Thanks!
Isidre